Measurement & Testing
| Fri 20 Mar 2026
Beijing, March 20 -- National Institute of Metrology, China has submitted a patent application for Three-dimensional Color Gamut Measuring System Based on Color Analyzer and Operation Method Thereof. This invention was developed by Xu Yingying, Chen Chi, Wang Pengfei, Ma Qiuchen, Li Bowen, Hou Tianhao, Hu Yurong and Liu Xia.
Th..