Software
| Sat 07 Nov 2026
Beijing, Nov. 7 -- Unit 61660 Of PLA has applied Chinese patent for Defect Management Method Based on Function Call Stack Backtracking and Collapse Sample Clustering. Hu Jingchuan, Zhu Tao, Chen Zhuo, Qu Jirui, Huang Weifeng, Yin Qidi, Zhou Yiqun, Xiong Ziming, Rao Jinlong, Hu Qi, Zhou Dandan, Wu Zhiyong, Guo Hao, Mu Yuan and Ly..