Semiconductor
| Mon 02 Nov 2026
Beijing, Nov. 2 -- Tianxin Interconnection Tech Co Ltd has secured a patent on Chip Aging Test Device. Zhao Yuebin, Chen Shaobiao, Liu Jianhui, Li Xiuyi, Zeng Quan, He Haiping, Li Xinqiang and Du Weikang developed the invention.
The patent application number is CN202520193665U 20250207. The patent publication number is CN2239..