Semiconductor
| Tue 05 May 2026
Geneva, May 5 -- Applied Mat Inc and Xie Mengyu have filed a patent application for Substrate Center Self Check Blade. This invention was developed by Xie Mengyu, Li Yanhui, Xuan Ziyue, Yan Shiming, Wang Fansheng, Cui Hanlin, Xu Shuda, Lang Caili, Tang Wenyi, Li Difan, Sun Lei and Byun Daniel.
The patent application number is..