Measurement & Testing
| Wed 20 May 2026
Beijing, May 20 -- Beijing University has filed a patent application for Focal Plane Adjusting Method for Detecting Cross Section Characteristics of Electron Beam. This invention was developed by Yu Fengjun, Liu Peng, Zhang Dacheng, Yuan Shiyang, Hua Xuanqing, Yu Zhiheng, Chen Yi, Mai Changyuan, Li Jiakang, Yang Fang and Li Ziyu..