Measurement & Testing
| Mon 13 Jul 2026
Beijing, July 13 -- CYG Sunri has applied Chinese patent for Test Device, Test System and Test Method. Yu Weiguo, Xian Qing, Zhou Xing, Bai Yongqi, Yan Xitao, Qiao Da, Duan Lin, Li Zhenghai, Qi Wenbo and An Xiaojing developed it.
The patent application number is CN202511937784 20251219. The patent publication number is CN1218..