Measurement & Testing
| Tue 20 Oct 2026
Beijing, Oct. 19 -- State Intellectual Property Office of China has awarded a patent to Jiangsu Tianke Heda Semiconductor and Beijing Tankeblue Semiconductor for Wafer Leak Rate Inspection Bearing Device. Chao Huan, Guo Yu, Peng Tonghua, Yang Jian, Bao Quanwen, Lou Yanfang, Kang Fubao, Zhang Wenwen, Liu Chunjun, Chen Jun, Wang S..