Measurement & Testing
| Wed 30 Sep 2026
Geneva, Sept. 29 -- Shanghai Dewu Information Group has submitted a patent application for Product Inspection Method, System and Apparatus, Program Product, and Storage Medium. This invention was developed by Li Xia, Sun Zhenglei, Jiang Weiming, Wei Chao, Lin Li, Guo Xiaowei, Fu Liren, Cheng Xiao, Wang Jianbiao, Zhang Kui, Wen S..