Measurement & Testing
| Sat 24 Oct 2026
Alexandria, Oct. 24 -- U.S. Patent and Trademark Office has awarded a patent to Yun Seokjung, Yeom Jiwon, Sohn Younghoon, Kim Souk, Kim Hoon, Kim Kwangeun, Korea Advanced Inst Of Science And Technology, Ryu Sungyoon, Hong Seungbum, Samsung Electronics Co Ltd and Yang Yusin for Test Apparatus and Test Method Thereof.
The patent..