Energy
| Wed 15 Jul 2026
Beijing, July 16 -- Harbin Institute Of Technology has applied Chinese patent for Defect Energy Level Depth Judgment Method, Device, Equipment and Medium. Liu Fengkai, Choi Su-hae, Yang Jianqun, Wei Yadong, Xu Xiaodong, Li Xingji and Lyu Gang developed it.
The patent application number is CN20251250675 20251231. The patent pu..