Electronics
| Wed 17 Sep 2025
Beijing, Sept. 18 -- China Academy of Space Technology has submitted a patent application for Carry Chain Test Circuit and Test Method. This invention was developed by Wang He, Qu Ruoyuan, Zhang Dayu, Wan Wang, Liang Peizhe, Yang Shuwen, Liu Yifan, Zhang Song, Zhu Ming, Wang Zheng and Ning Yongcheng.
The patent application nu..