Electronics
| Tue 16 Jun 2026
Taipei, June 16 -- Hon Hai Precision Industry has sought patent for Fault Detection Process Optimization Methods, Electronic Device and Storage Medium. This invention was developed by Liou Ying-hsin, Wang Xue, Hsu Fu-chiang, Zou Yi-xin, Liu Shih-hao, Chang Chung-pin, Wu Zong-he, Tu Wen-bo, Zhang Chun-yang, Deng Zhi-gang, Liang S..